All van der Waals Semiconducting PtSe<sub>2</sub> Field Effect Transistors with Low Contact Resistance Graphite Electrodes.
basic_science · Level V
Where this comes from
- Record sourced from PubMed, PMID 38789104.
- Also identified by DOI 10.1021/acs.nanolett.4c00956 and PMC identifier 11157664.
- Licence recorded as CC BY-NC-ND.
- Because redistribution is not established, this page shows the abstract only. Follow the links below for the full text.
Abstract
Contact resistance is a multifaceted challenge faced by the 2D materials community. Large Schottky barrier heights and gap-state pinning are active obstacles that require an integrated approach to achieve the development of high-performance electronic devices based on 2D materials. In this work, we present semiconducting PtSe<sub>2</sub> field effect transistors with all-van-der-Waals electrode and dielectric interfaces. We use graphite contacts, which enable high <i>I</i><sub>ON</sub>/<i>I</i><sub>OFF</sub> ratios up to 10<sup>9</sup> with currents above 100 μA μm<sup>-1</sup> and mobilities of 50 cm<sup>2</sup> V<sup>-1</sup> s<sup>-1</sup> at room temperature and over 400 cm<sup>2</sup> V<sup>-1</sup> s<sup>-1</sup> at 10 K. The devices exhibit high stability with a maximum hysteresis width below 36 mV nm<sup>-1</sup>. The contact resistance at the graphite-PtSe<sub>2</sub> interface is found to be below 700 Ω μm. Our results present PtSe<sub>2</sub> as a promising candidate for the realization of high-performance 2D circuits built solely with 2D materials.