High-Performance CsPbI<sub>3</sub> Quantum Dot Photodetector with a Vertical Structure Based on the Frenkel-Poole Emission Effect.

Wei, Huili; Ji, Xiangyu; Cao, Jinguo; He, Wuguang; Liu, Hong; Pan, Zexun; Song, Xin; Sun, Qiang et al. · ACS Nano · 2024

basic_science · Level V

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Abstract

The selection of photoactive materials and the design of device structures are critical to the photoelectronic performance of photodetectors. This study reports on a vertically structured photodetector device with rapid, stable, and efficient photoelectric performance across the UV-visible broadband range based on the Si<sup>++</sup>/SiO<sub>2</sub>/Au/single-layer graphene/CsPbI<sub>3</sub> quantum dots (QDs) configuration. In this specific device structure, a relatively high conductivity Si<sup>++</sup>/SiO<sub>2</sub> wafer was used as the substrate, a CsPbI<sub>3</sub> QD film with high light absorption was used as the photoactive layer, and a monolayer graphene with high conductivity was inserted between the substrate and the CsPbI<sub>3</sub> QD film to form a heterojunction with the QD film. Based on the Frenkel-Poole emission effect arising from the high trap state density within the SiO<sub>2</sub> layer, the device exhibited excellent photoelectric performances. Especially at a wavelength of 365 nm, a photocurrent responsivity of 2319 A/W, a specific detectivity of 1.15 × 10<sup>14</sup> Jones, an external quantum efficiency of 7883%, and an on/off time of 39/36 ms at a Si<sup>++</sup> terminal voltage of -80 V and an optical power density of 84.03 nW/cm<sup>2</sup> can be achieved.