Mechanisms of Defect-Mediated Memristive Behavior in MoS<sub>2</sub> Monolayer.
basic_science · Level V
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- Record sourced from PubMed, PMID 39361515.
- Also identified by DOI 10.1021/acs.nanolett.4c03792.
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Abstract
The switching dynamics of a Au∥V<sub>S<sub>2</sub></sub>@MoS<sub>2</sub> atomristor is explored by first-principles computations of the atomic-configuration energy and electron transport. It is found that external bias can reduce the energy barrier between the two (high- and low-) conduction states, to achieve nonvolatile resistive switching. We find that the force acting on the switching atom is a combination of electrostatic force (while its charge is induced both electrostatically and chemically) and also by electron-wind, whose effect may hinder the writing process at larger bias. The analysis uncovers how the writing and reading processes of the atomristor depend on several factors: (i) atomic structure details of the Au tip; (ii) the space-gap distance between the tip and MoS<sub>2</sub> layer; and (iii) tip metal choice. The fundamental understanding of switching events provides useful guidance for memristor design and possible limitations.