Stacking selected polarization switching and phase transition in vdW ferroelectric α-In<sub>2</sub>Se<sub>3</sub> junction devices.
basic_science · Level V
Where this comes from
- Record sourced from PubMed, PMID 39622832.
- Also identified by DOI 10.1038/s41467-024-54841-7 and PMC identifier 11612147.
- Licence recorded as CC BY-NC-ND.
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Abstract
The structure and dynamics of ferroelectric domain walls are essential for polarization switching in ferroelectrics, which remains relatively unexplored in two-dimensional ferroelectric α-In<sub>2</sub>Se<sub>3</sub>. Interlayer interactions engineering via selecting the stacking order in two-dimensional materials allows modulation of ferroelectric properties. Here, we report stacking-dependent ferroelectric domain walls in 2H and 3R stacked α-In<sub>2</sub>Se<sub>3</sub>, elucidating the resistance switching mechanism in ferroelectric semiconductor-metal junction devices. In 3R α-In<sub>2</sub>Se<sub>3</sub>, the in-plane movement of out-of-plane ferroelectric domain walls yield a large hysteresis window. Conversely, 2H α-In<sub>2</sub>Se<sub>3</sub> devices favor in-plane domain walls and out-of-plane domain wall motion, producing a small hysteresis window. High electric fields induce a ferro-paraelectric phase transition of In<sub>2</sub>Se<sub>3</sub>, where 3R In<sub>2</sub>Se<sub>3</sub> reaches the transition through intralayer atomic gliding, while 2H In<sub>2</sub>Se<sub>3</sub> undergoes a complex process comprising intralayer bond dissociation and interlayer bond reconstruction. Our findings demonstrate tunable ferroelectric properties via stacking configurations, offering an expanded dimension for material engineering in ferroelectric devices.