Gradient Distributed and Tightly Integrated Perovskite Heterojunction Constructed by Electric Field-Driven Ion Deposition for High-Performance X-ray Detection.
basic_science · Level V
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- Record sourced from PubMed, PMID 39639797.
- Also identified by DOI 10.1021/acs.nanolett.4c04488.
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Abstract
Perovskite heterojunctions combine the advantages of two different components but suffer difficulties in the tightness of interconnection and limitation of material selection. Here we report an electric field-driven ion deposition (EFID) strategy that controllably deposits perovskite ions on heterogeneous single crystals to form a gradient heterojunction with tight integration. The interconnection force of the gradient heterojunction by the EFID method is much better than that of the solution-grown heterojunction, which is easily decomposed. An EFID-enabled heterojunction was constructed by depositing the 3D MAPbI<sub>3</sub> perovskite on the 2D (FPEA)<sub>2</sub>PbI<sub>4</sub> perovskite, exhibiting an excellent X-ray sensitivity of 2.12 × 10<sup>4</sup> μC Gy<sup>-1</sup> cm<sup>-2</sup> under an electric field of 500 V mm<sup>-1</sup> and a low limit of detection (LoD) less than 12.01 nGy s<sup>-1</sup>, substantially better than that of the pristine 2D or 3D counterparts. This work expands the methodology for constructing perovskite heterojunctions, offering new perspectives for future perovskite heterojunction engineering.