Imaging Electron Beam-Sensitive Twisted Hybrid Perovskite Bilayers at One-Angstrom Resolution.
basic_science · Level V
Where this comes from
- Record sourced from PubMed, PMID 39842041.
- Also identified by DOI 10.1021/acsnano.4c11759.
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Abstract
Twisted halide perovskite bilayers, a type of moiré material, show square moiré patterns with exciting optical properties. Atomic-scale structure analysis and its correlation with properties are difficult to achieve due to the extreme sensitivity of organic-inorganic halide perovskites to the illuminated electron beam in conventional/scanning transmission electron microscopy. Here, we developed a low-dose exit wave reconstruction methodology with a real-space resolution of one angstrom at ∼50 e/Å<sup>2</sup>, which recovers the phase information on the moiré fringes in CH<sub>3</sub>NH<sub>3</sub>PbI<sub>3</sub> (MAPbI<sub>3</sub>) twisted perovskite bilayers at atomic scale, enabling detailed structural analysis of defects and corresponding strain distribution in such moiré materials. This work provides an atomic-level understanding of electron beam-sensitive twisted bilayer materials.