An Original Positive-Up-Negative-Down Protocol for Electrical Characterization of Antiferroelectric Materials.
basic_science · Level V
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- Record sourced from PubMed, PMID 40227139.
- Also identified by DOI 10.1021/acs.nanolett.5c00851.
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Abstract
This work introduces the AFE-PUND measurement method, an original positive up negative down (PUND) protocol intended to accurately study antiferroelectric (AFE) thin-film behavior. As for its FE counterpart, the AFE-PUND method isolates switching currents from nonswitching contributions, enabling a precise extraction of saturation polarization and coercive fields from hysteresis loop curves. In this paper, AFE-PUND was deployed on AFE ZrO<sub>2</sub> films of varying thicknesses. The results reveal that saturation polarization increases with film thickness, indicating enhanced domain stability, while endurance cycles showcase the wake-up effect and its eventual fatigue-induced degradation in thicker films. Similarly, coercive fields decrease with thickness, reflecting reduced switching barriers and a sharper transition between the tetragonal and orthorhombic phases. AFE-PUND establishes itself as an extremely valuable method for advancing the understanding and optimization of AFE materials.