Phenomenological model of crack patterns in thin colloidal films undergoing desiccation.
basic_science · Level V
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- Record sourced from PubMed, PMID 40411040.
- Also identified by DOI 10.1103/PhysRevE.111.045404.
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Abstract
A number of geometric and topological properties of samples of crack-template-based conductive films are examined to assess the degree to which Voronoi diagrams can successfully model structure and conductivity in such networks. Our analysis suggests that although Poisson-Voronoi diagrams are only partially successful in modeling structural features of real-world crack patterns formed in films undergoing desiccation, such diagrams can nevertheless be useful in situations where topological characteristics are more important than geometric ones. A phenomenological model is proposed that is more accurate at capturing features of the real-world crack patterns.