Calibration-Free Measurement of the Phonon Temperature around a Single Emitter.

Abstract

The emission properties of a localized solid-state emitter are strongly influenced by its environment. The coupling to acoustic phonons impacts the coherence of the emitter and its temperature dependence, and also results in the apparition of phonon sidebands besides the sharp zero-phonon line. Here, we present a method for measuring the absolute temperature of a localized emitter by directly plotting the ratio of the Stokes and anti-Stokes components of the phonon sideband as a function of the shift from the zero-phonon line. This approach requires no calibration and knowledge of the system, making it applicable to a wide range of emitters and materials. We validate the method using a CdSe quantum dot in a ZnSe nanowire. We thus show that the quantum dot is significantly heated under nonresonant excitation when increasing the incident power at low temperature which is ascribed to the drop in thermal conductivity at these temperatures.