Phase Imaging Methods in the Scanning Transmission Electron Microscope.
review · Level V
Where this comes from
- Record sourced from PubMed, PMID 40580140.
- Also identified by DOI 10.1021/acs.nanolett.4c06697 and PMC identifier 12257644.
- Licence recorded as CC BY.
- The licence permits redistribution, so the abstract is shown in full and the full text is available from the publisher.
Abstract
Scanning transmission electron microscopy (STEM) has become an essential tool for investigating materials, providing detailed characterization at nano and atomic scales. By combining subangstrom resolution Z-contrast imaging with analytical X-ray and electron spectroscopies, STEM allows the visualization of atomic arrangements, crystal defects, and interfaces, understanding sample properties and correlating these with the functionalities of materials and devices. Recent advancements in phase imaging techniques, including differential phase contrast (DPC) and electron ptychography, have further enhanced STEM capabilities. These methods allow direct imaging of electromagnetic fields, the study of beam-sensitive materials with high dose efficiency, or resolving the 3D structure of materials, proving invaluable for investigating intricate nanoscale phenomena. This review introduces phase imaging methods in the STEM and explores how the most recent innovations are driving progress in nanoscience, deepening material insights and shaping next-generation applications in electronics, energy storage, and catalysis.