Growth of Two-Inch Perovskite CsPbBr<sub>3</sub> Single-Crystal with High Irradiation Resistance for X-ray Detection.
basic_science · Level V
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- Record sourced from PubMed, PMID 40970810.
- Also identified by DOI 10.1002/adma.202512788.
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Abstract
All-inorganic perovskite CsPbBr<sub>3</sub> crystals have demonstrated considerable promise in γ-ray and X-ray detection, owing to their excellent optoelectronic properties. However, the growth of large single crystals (SCs) and the stability of CsPbBr<sub>3</sub>-based X-ray detectors under high-energy radiation exposure remain unexplored. In this study, a two-inch CsPbBr<sub>3</sub> single-crystal is grown using the vertical Bridgman (VB) method, and its irradiation resistance in X-ray detection performance is investigated after exposure to <sup>60</sup>Co γ-ray radiation. Compared with unirradiated samples, the crystals irradiated with a dose of 10 Mrad exhibit a higher trap density (1.59 × 10<sup>10</sup> cm<sup>-3</sup>) and a lower resistivity (8.2 × 10<sup>7</sup> Ω cm). However, the Bi/CsPbBr<sub>3</sub>/Au devices with asymmetric electrode structure exhibit an enhanced signal-to-noise ratio (14), a stable and low dark current density (7 nA cm<sup>-2</sup>) with a current drift of 5.8 × 10<sup>-15</sup> A cm<sup>-1</sup> s<sup>-1</sup> V<sup>-1</sup>, and a high sensitivity of 55722 µC Gyair<sup>-1</sup> cm<sup>-2</sup> for X-ray detection at an electric field of 3000 V cm<sup>-1</sup>. Moreover, the irradiated device remained stable X-ray response characteristics after 220 days aging. These findings highlight the exceptional defect tolerance and irradiation stability of CsPbBr<sub>3</sub> devices for high-performance radiation detections, offering critical insights for their long-term deployment in high-radiation environments.