Metal-Organic Chemical Vapor Deposition of 2D Semiconducting Bi<sub>2</sub>O<sub>2</sub>S for High-Performance Field-Effect Transistor.
basic_science · Level V
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- Record sourced from PubMed, PMID 41321270.
- Also identified by DOI 10.1002/adma.202501269.
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Abstract
Bi<sub>2</sub>O<sub>2</sub>S has emerged as a promising 2D semiconductor for high-performance field-effect transistor (FET) applications, effectively addressing limitations observed in conventional 2D materials, including environmental instability, challenges with achieving optimal bandgaps, and insufficient static power efficiency. However, practical application of Bi<sub>2</sub>O<sub>2</sub>S has been hindered by synthesis challenges; previous methods often relied on high-temperature processes (>700 °C) for precursor sublimation resulting in the formation of undesired phases or solution-based approaches that compromise material quality. In this work, the growth of single-crystalline Bi<sub>2</sub>O<sub>2</sub>S nanoplates at a low temperature of ≈400 °C is demonstrated using metal-organic chemical vapor deposition (MOCVD), achieving a bandgap of 1.2 eV compatible with Si-based devices. Fabricated Bi<sub>2</sub>O<sub>2</sub>S-based FETs through this process exhibit excellent electrical performance, with a maximum on/off ratio of 3.6 × 10⁹ and a field-effect mobility of 227 cm<sup>2</sup> V<sup>-1</sup> s<sup>-1</sup>, benefiting from the low effective mass (0.15 m<sub>0</sub>) inherent to Bi<sub>2</sub>O<sub>2</sub>S. Furthermore, Bi<sub>2</sub>O<sub>2</sub>S photodetectors display remarkable optoelectronic characteristics, including a high responsivity of 11,577 A W<sup>-1</sup>, rapid response time in the millisecond range, and a specific detectivity of 10<sup>14</sup> Jones. These results confirm Bi<sub>2</sub>O<sub>2</sub>S's potential as a versatile semiconductor for next-generation electronics, offering both BEOL-compatible low-temperature synthesis and high-speed, low-power device capabilities.