Ultrathin Single-Walled Carbon Nanotube Surface Wave Absorbers for Terahertz Dielectric Waveguides.
basic_science · Level V
Where this comes from
- Record sourced from PubMed, PMID 41330903.
- Also identified by DOI 10.1038/s41467-025-66559-1 and PMC identifier 12675539.
- Licence recorded as CC BY.
- The licence permits redistribution, so the abstract is shown in full and the full text is available from the publisher.
Abstract
Dielectric waveguides are an emerging platform for terahertz (THz) integrated circuits, but a key challenge for dense integration is the realization of terminations that enable both multi-port device characterization and elimination of electromagnetic interference. Here, we demonstrate a compact, broadband termination by coating silicon waveguides with ultrathin single-walled carbon nanotube (SWCNT) films. Fabricated via a floating-catalyst (aerosol) chemical vapor deposition process, film thicknesses vary from 2 to 53 nm and are characterized in 140-220 GHz. A 53 nm thick film introduces up to 47 dB of attenuation while maintaining over 20 dB reflection loss, confirming nearly reflection-free absorption. Shielding analysis shows absorption dominates over reflection, and a record specific shielding efficiency of 5.5 × 10<sup>9</sup> dB cm<sup>2</sup> g<sup>-1</sup> is achieved. This approach offers a footprint-efficient solution for high-density THz circuits without bulky, radiative terminations.