Percolation-Limited Threshold Switching in Strain-Graded Mott Devices.

Cho, Utaek; Lee, Dong Kyu; Lee, Sungwon; Son, Junwoo · ACS Nano · 2026

basic_science · Level V

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Abstract

The threshold switch operated by a field-driven insulator-to-metal transition in VO<sub>2</sub> has attracted considerable interest for emerging devices due to its nonlinear and sensitive response to external voltage. However, the nucleation barrier intrinsic to the first-order phase transition causes a finite time delay before the abrupt rise in currents under voltage pulses, thereby hindering energy-efficient device operation. Here, we demonstrate that the strain-graded VO<sub>2</sub> epilayer on Pt nanoislands (NIs) enables percolation-limited threshold switching by promoting the nucleation process of metallic phases during voltage-triggered phase transitions. Unlike constantly strained VO<sub>2</sub>, the Pt NIs locally disrupt lattice coherency at the VO<sub>2</sub>/TiO<sub>2</sub> interface, facilitating gradual relaxation of misfit strain energy; tailoring the spatial strain distribution in the strain-graded VO<sub>2</sub> films effectively lowers the activation barrier for the nucleation events of metallic domains, achieving one-twentieth lower incubation time (τ<sub>inc</sub>) compared to constantly strained VO<sub>2</sub> films. Moreover, this percolation-limited phase evolution stabilizes an intermediate metastable phase (i.e., negative differential resistance), enabling robust self-oscillatory behavior across a wide current range with enhanced tunability and dynamic controllability. These findings tailor the phase transition dynamics for ultrafast and energy-efficient switching applications.