High-κ Perovskite-Like Ternary Niobium Oxide Dielectrics for 2D Electronics.
basic_science · Level V
Where this comes from
- Record sourced from PubMed, PMID 41504624.
- Also identified by DOI 10.1002/adma.202520423 and PMC identifier 12921349.
- Licence recorded as CC BY.
- The licence permits redistribution, so the abstract is shown in full and the full text is available from the publisher.
Abstract
High-κ dielectrics with exceptional interface quality are essential for the field-effect control of nanoscale transistors. However, their design remains challenging due to competing atomic-scale polarization requirements. Here, we demonstrate nonlayered perovskite-like ternary niobium oxides (CaNb<sub>2</sub>O<sub>6</sub>, KNb<sub>3</sub>O<sub>8</sub>, and Na<sub>2</sub>Nb<sub>4</sub>O<sub>11</sub>) as promising candidates, where strong Nb 4d-O 2p covalent hybridization enables pronounced Nb<sup>5+</sup> ionic displacements and enhanced polarization, while ionic bonding from intercalated Ca/K/Na suppresses electronic transitions, widening the bandgap and enhancing stability via configurational entropy. We successfully synthesize these high-quality nanoflakes through a scalable molten-salt method. Crucially, these oxides demonstrate a combination of high dielectric constants (∼16, 9, and 68 for CaNb<sub>2</sub>O<sub>6</sub>, KNb<sub>3</sub>O<sub>8</sub>, and Na<sub>2</sub>Nb<sub>4</sub>O<sub>11</sub>, respectively), wide bandgaps (∼4 eV), large breakdown field strengths (> 4.9 MV cm<sup>-1</sup>), and excellent air stability. Furthermore, due to the low-contamination transfer via a fully dry process, MoS<sub>2</sub> field-effect transistors with these gate dielectrics achieve low subthreshold swings (∼60 mV dec<sup>-1</sup>), ON/OFF ratios > 10<sup>7</sup>, gate leakage currents below 10<sup>-6</sup> A cm<sup>-2</sup>, and ultralow trap densities. We show high-performance NOT and NAND gates using a CaNb<sub>2</sub>O<sub>6</sub> dielectric layer, with the inverter achieving a static power consumption of < 0.02 µW and a gain of ∼20. This work provides new opportunities for the development of next-generation 2D electronics devices.