Electron Microscopy Measurement of Picometer-Level Distortion Induced Local Phonons at a Defect.
basic_science · Level V
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- Record sourced from PubMed, PMID 41558854.
- Also identified by DOI 10.1021/acs.nanolett.5c05660.
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Abstract
Defects in oxides usually exhibit exotic properties that may be associated with local lattice dynamics. Here, at atomic spatial resolution, we directly measure phonon modes of an antiphase boundary (APB) in SrTiO<sub>3</sub> freestanding membrane and correlate them with the picometer-level structural distortion. We find that the SrTiO<sub>3</sub> APB introduces new defect phonon modes that are absent in bulk SrTiO<sub>3</sub>. These modes are highly sensitive to the subtle structure distortion; i.e., the SrTiO<sub>3</sub> APB generates the local electric dipoles, forming an antiferroelectric configuration, which significantly change the frequencies of transverse optical (TO) and longitudinal optical (LO) modes. When the local phonons are correlated with the subtle structural distortion, our findings provide valuable insights into understanding the defect properties in complex oxides and essential information for their applications such as thermoelectric devices.