Shortwave Infrared Upconversion Imaging with Tunable Dual-Resonance Microcavity.
basic_science · Level V
Where this comes from
- Record sourced from PubMed, PMID 42178918.
- Also identified by DOI 10.1021/acs.nanolett.6c01395.
- No licence information is recorded for this record.
- Because redistribution is not established, this page shows the abstract only. Follow the links below for the full text.
Abstract
Shortwave infrared (SWIR) imaging is widely employed in light detection and ranging, biomedical imaging, industrial inspection, and night vision. However, current InGaAs-based SWIR cameras remain expensive due to their complex fabrication and cooling requirements. Here, we report a cost-effective alternative using a standard silicon camera, augmented by upconversion from NaYF<sub>4</sub>:Er@NaYF<sub>4</sub> core-shell nanoparticles in a tunable, dual-resonance Fabry-Pérot cavity. A spatially varying cavity length allows spectral tunability, and the dual-resonance design enhances infrared absorption and visible emission simultaneously, resulting in up to 10<sup>4</sup>-fold increase in upconversion intensity over a broad range of excitation wavelengths (1530-1570 nm). This enhancement enables imaging at 1550 nm with sub-10 μm spatial resolution, comparable to InGaAs-based systems, but at a significantly lower cost. We further demonstrate the potential of this platform for silicon wafer alignment and low-visibility imaging. This work introduces a scalable, cost-effective approach for SWIR imaging by leveraging mature silicon technologies and cavity-enhanced photon upconversion.