Topochemical Fluorination Yields Long-Range Superlattice in Epitaxial La<sub>2</sub>NiO<sub>4</sub> Thin Films.

Turkiewicz, Ari B; Jiang, Abigail Y; Sung, Suk Hyun; Ferenc Segedin, Dan; Pan, Grace A; Taylor, Nicole K; Goh, Megan E; Bambrick-Santoyo, Maria et al. · ACS Nano · 2026

basic_science · Level V

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Abstract

Layered nickelates host a variety of correlated electronic phenomena that can be tuned through doping, strain, and dimensionality. Here, we explore anion engineering as an alternative tuning knob to modify the properties of layered nickelate thin films. First, we synthesize epitaxial thin films of the <i>n</i> = 1 Ruddlesden-Popper nickelate, La<sub>2</sub>NiO<sub>4</sub>. We then achieve transformation to crystalline La<sub>2</sub>NiO<sub>3</sub>F<sub>2</sub> thin films through redox-neutral, topochemical fluorination. X-ray diffraction and electron microscopy confirm the atomic structure and crystallinity of La<sub>2</sub>NiO<sub>4</sub> and La<sub>2</sub>NiO<sub>3</sub>F<sub>2</sub>. X-ray absorption spectroscopy further confirms a NiO<sub>4</sub>F<sub>2</sub> coordination environment and Ni<sup>2+</sup> oxidation state following fluorination, while electronic transport measurements reveal semiconducting behavior across a range of compressive strain states (ϵ = -1.9% to -5.8%). High dynamic range reciprocal space mapping reveals nanoscale periodicity that emerges upon fluorination, and computational analysis indicates that La<sub>2</sub>NiO<sub>3</sub>F<sub>2</sub> is susceptible to transverse structural distortions. Overall, we illustrate topochemical fluorination and anion engineering as a tuning knob to modify the chemical and electronic properties of complex oxide thin films.