Electric current as a stabilizing thermodynamic field in metallic crystals.
basic_science · Level V
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- Record sourced from PubMed, PMID 42443194.
- Also identified by DOI 10.1038/s41467-026-75477-9.
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Abstract
Electric current is typically associated with electromigration damage, but under steady current-carrying conditions it can also bias lattice stability. Here, in situ synchrotron X-ray diffraction and nanodiffraction show that a current density of <math xmlns="http://www.w3.org/1998/Math/MathML"><mn>1.5</mn><mo>×</mo><msup><mrow><mn>10</mn></mrow><mrow><mn>3</mn></mrow></msup></math>A cm<sup>-2</sup> retains hexagonal η-Cu<sub>6</sub>Sn<sub>5</sub> under conditions where temperature-matched thermal treatment drives the η → η' transformation. The retained η phase accommodates the current through anisotropic elastic distortion, with c-axis expansion of ~1.3% and basal-plane contraction of ~0.8%, accompanied by plane-selective dislocation rearrangement and partial lattice recovery after current removal. Grain-resolved stress/strain mapping yields a spatially averaged post-ECS principal-stress scale of ~30-40 MPa, consistent with an order-of-magnitude electron-wind estimate, while the associated elastic-energy density of 9-12 MJ m<sup>-3</sup> remains well below the reconstructive barrier of ~150 MJ m<sup>-3</sup>. These results identify a phenomenological electron-wind-driven elastic accommodation regime in η-Cu<sub>6</sub>Sn<sub>5</sub> under the present current density and experimental geometry, accompanied by plane-selective defect rearrangement, and are experimentally consistent with a Gibbs-like <math xmlns="http://www.w3.org/1998/Math/MathML"><mi>T</mi><mo>-</mo><mi>σ</mi><mo>-</mo><mi>J</mi></math> description of the current-carrying steady state.