Ion Diffusion-Induced Multi-Interface Reconstruction for High-Resolution Perovskite X-Ray Flat-Panel Detectors.
basic_science · Level V
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- Record sourced from PubMed, PMID 42554432.
- Also identified by DOI 10.1002/adma.74479.
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Abstract
A critical challenge with state-of-the-art perovskite x-ray flat-panel detectors (FPDs) is their limited spatial resolution, primarily due to the presence of multiple poorly integrated interfaces. In this study, we report high-resolution perovskite FPDs that achieve a record modulation transfer function (MTF) among polycrystalline perovskite direct-conversion x-ray FPDs of 6.2 line pairs per millimetre (lp mm<sup>-1</sup>) with a large imaging area of 8.5 × 8.5 cm<sup>2</sup> through an interface reconstruction strategy specifically tailored for perovskites. We reveal that Fick's law-guided ion diffusion across hundreds of microns-thick perovskites contributes to a reconstructed x-ray sensing layer with highly integrated interfaces and a gradient energy band alignment. As such, we have realized an ultrasensitive x-ray detection with a leading sensitivity-to-dark current ratio (2.61 × 10<sup>11</sup> µC Gy<sub>air</sub> <sup>-1</sup> A<sup>-1</sup>) and outstanding stability under ambient conditions over 5760 h. The prototype perovskite FPDs exhibit a detective quantum efficiency (76.9%) and enable high-resolution x-ray imaging at a low dosage (0.98 µGy<sub>air</sub>), substantially lower than previous polycrystalline perovskite FPDs. Our multi-interface reconstruction strategy successfully addresses long-standing issues in perovskite FPDs, advancing their progress from laboratory prototypes to commercial applications in digital radiography and industrial inspection.